Hoyer, J. ., Voss, C. ., Strehle, J. ., Venz, J. ., Pieper, L. ., Wittchen, H. ., … Beesdo-Baum, K. . (2020). Test-retest reliability of the computer-assisted DIA-X-5 interview for mental disorders. BMC Psychiatry, 20(1), 280. https://doi.org/10.1186/s12888-020-02653-6 (Original work published 2020)